| Unit |
Lecture Video
and PowerPoint Availability
|
Associated Laboratory Availability
|
Topics Covered |
| Unit 1 - Characterization Overview |
|
Lecture 1: Touching, Seeing, Chemically Detecting, and Hearing at Our Size Scale
|
PPT
PDF
Video
|
E SC 216 Labs
|
Characterizing materials and structures at our size scale, the five senses, touching at our size scale, seeing at our size scale, chemically detecting at our size scale, hearing at our size scale, introduction to touching, seeing, chemically detecting, and hearing at the nano- scale |
| Lecture 2: The Use of Probes, Beams, and Waves for Characterization at the Nano-scale |
PPT
PDF
Video
|
|
The tools for characterizing materials and structures at the nano-scale, probes, photon beams, electron beams, ion beams, acoustic waves |
| Unit 2 - Basic Characterization Techniques |
| Lecture 1: Basic Characterization Techniques |
PPT
PDF
Video
|
E SC 216 Labs
|
Introduction, optical microscopes, profilometry, ellipsometry, reflective spectroscopy, contact angle |
| Unit 3 - Microscopy |
Lecture 1: Fundamental SEM Operation
|
Video
|
E SC 216 Labs |
Overview of the physics of operation for the SEM
|
|
Lecture 2: Electron Microscopy Overview
|
PPT
PDF
Video
|
E SC 216 Labs |
Scanning electron microscopy, field emission scanning electron microscopy, transmission electron microscopy, energy dispersive spectroscopy |
Lecture 3: Fundamental FESEM Operation
|
Video
|
E SC 216 Labs |
Overview of the Zeiss FESEM. Includes hardware function and operation software |
| Lecture 4: Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-scale |
PPT
PDF
Video
|
E SC 216 Labs |
FIB overview, FIB operation, FIB applications |
| Lecture 5: Confocal Microscopy |
PPT
PDF
Video
|
E SC 216 Labs |
Introduction, optical microscopy, types of optical microscopes, confocal microscopy, examples |
| Lecture 6: SIMS |
PPT
PDF
Video
|
E SC 216 Labs |
SIMS - Secondary Ion Mass Spectrometry. Overview - History, Principles of Operation, SIMS issues. |
| Unit 4 - Probe Methods |
| Lecture 1: Advanced Scanning Probe Microscopy, Part 1 |
PPT
PDF
Video
|
E SC 216 Labs |
Overview of scanning probe techniques, scanning tunneling microscopy, atomic force microscopy, hardware and components, tip/sample interactions |
| Lecture 2: Advanced Scanning Probe Microscopy, Part 2 |
Video
|
E SC 216 Labs |
Common modes of operation, pitfalls and image artifacts, example of instrument operation |
| Unit 5 - X-Ray Methods |
| Lecture 1: X-Ray Photoelectron Spectroscopy (XPS) |
PPT
PDF
Video
|
E SC 216 Labs |
Basic principles, instrumentation, peak characteristics, quantitative analysis, depth profiling |
| Lecture 2: Sample Preparation for Powder X-ray Diffraction |
Video
|
E SC 216 Labs |
Typical methods used for sample preparation to obtain good data using X-Ray diffraction |
| Unit 6 - Fundamental Review |
| Lecture 1: Fundamentals of Metrology and Characterization for Nanotechnology |
PPT
PDF
Video
|
E SC 216 Labs |
Common applications in nanotechnology |
