NEATEC offers a FREE workshop on Atomic Force Microscopy (AFM) with particular emphasis in techniques on how to prepare and use a desktop Atomic Force Microscope, how to create samples and how to interpret AFM images. The short course is designed for science and technology high-school teachers who plan to use the acquired knowledge in classroom activities.

By the end of the training you will be able to:

• Understand the science behind the creation of images by an AFM
• Know how to properly handle an AFM
• Understand how to prepare samples
• Understand how to load and take images of the sample
• Know how to replace AFM probes