Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) has traditionally been the most frequently used micro-/nano- characterization technique to overcome the optical losses coming from lenses. This talk is going to begin by discussing the fundamental blocks of an SEM starting from the electron beam emission. Presenters will talk about the key concepts like working distance, beam current, aberration, and their effects on resolution and depth of focus. Beam specimen interactions will be categorized and studied. Various detection types will be introduced. Simple interactive Monte Carlo simulations will accompany the talk to understand the importance of low keV imaging. Furthermore, a very useful online tool that is available on myscope.training will be run together. The seminar will also connect to a Field Emission (FE) SEM tool remotely and carry out an actual demo with the participants. In the remaining time, the seminar will go over the basics of Electron Probe MicroAnalysis (EPMA) and compare it with the traditional SEM. Finally, the workshop will look into Electron BackScatter Diffraction (EBSD) characterization technique and see what kind of new information can be collected about the specimen. No prior experience in any of these characterization methods will be required for attendance. The talk will aim to discuss the basic ideas and guide the interested participants in the right direction to get a deeper understanding of the shared supplementary materials.

Target audience: post-secondary science and technology teachers, vocational-technical teachers, & school administrators who are investigating adding a Nanotechnology aspect to their curriculum.