These presentation slides, made available by the Nanotechnology Applications and Career Knowledge Support Center (NACK Center), provide an introduction to the concept of nano-characterization. The presentation begins with a brief overview of NACK Center, and a detailed description of nano-characterization which is defined as "the manipulation of matter at the atomic level." Instruments that can be used for nano-characterization, Scanning Probe Microscopy (SPM) and Scanning Electron Microscopy (SEM), are discussed in great detail. The presentation concludes with additional resources and a discussion of Remote Access, "a way to utilize high-tech equipment at a research institution through an internet connection at any school."
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