Photonics in Nanotechnology Measurements: A Study of Atomic Force Microscopy

This 36-page module, developed by the National Center of Optics and Photonics Education, discusses the role of optics and lasers in optoelectronics. This module "covers photonics devices in atomic force microscopy (AFM), measurement methods used in AFM, modes of operation of an AFM, applications of AFM, and advantages and disadvantages of AFM." The module further discusses how photonics principles make the AFM a useful nanotechnology tool. The following sections are included: Introduction, Prerequisites, Objectives, Scenario, Subject Matter, Laboratory Exercises, and more.