E SC 216 Associated Laboratory Availabilty

This web page, from the Nanotechnology Applications and Career Knowledge Support Center (Nack Center) includes a unit outline and supplemental laboratories that are part of the E SC 216: Basic Characterization Techniques course. "This course provides an overview of the characterization and of the testing techniques used for materials and structures which involve the nano-scale." The following labs are included:

• Elipsometry Lab
• Profilometry Lab
• SEM/AFM Practice Labs
• Transmission Electron Microscopy
• Introduction to FESEM
• Process Control: Intermittent Mode & Non-Contact Mode AFM
• Process Control: SP Imagine Analysis/Processing Software
• Magnetic Force & Scanning Tunneling Microscopy

Each lab includes a variety of information, such as an objective, background information, a detailed procedure, charts and tables, and follow-up questions. Labs are available to download in either .doc or .pdf formats. Course lectures are available to view separately. Users must set up a free account to download the materials.